Wafer Probe card solutions | 美容美髮公開資訊

MPI探針卡是各種半導體生產測試的成熟解決方案，包括晶圓大批量生產（HVM）。 基於改進的“屈曲光束”技術- 眼鏡蛇，這些卡適用於焊盤圖案，如全陣列，半陣列， ... Read More

探針卡（英語：Probe card）是晶圓與电子测试系统之間的媒介。探針卡通常直接放在探測器上並用接線連接測試機。它的目的是提供晶片與測試機之間的連結，並完成晶圓測試 ... Read More

A probe card is an interface between an electronic test system and a semiconductor wafer. Typically the probe card is mechanically docked to a prober and ... Read More

A probe card is a jig used for electrical testing of an LSI (large-scale integrated circuit) chip on a wafer during the wafer test process in LSI ... Read More

MPI Probe Cards are a proven solution for a variety of semiconductor production tests including on wafer high volume manufacturing (HVM). Read More

Probe Card for IC Testing 探針卡（probe card）是應用在積體電路（IC）尚未封裝前，對裸晶以探針（probe）做功能測試， ... 《圖二晶圓針測（Wafer Probing）說明》 ... Read More

Probe card with spring contact probes for WlcsP, siP, analog and mixed ... manufacturing probe cards for wafer testing is based on handling finest ... Read More

A probe card is essentially an interface or a board that is used to perform wafer test for a semiconductor wafer. It is used to connect to the integrated ... Read More

Production RF probe cards are rugged, robust, and well suited for the rigors of high-performance wafer sort. Their industry-leading signal integrity and ... Read More